LONG WORKING DISTANCE 3D MEMS PROFILERS
FOR DYNAMIC MEASUREMENTS OF MEMS DEVICES
BASED ON STATE-OF-THE-ART, PATENTED, LONG WORKING
DISTANCE INTERFERENCE MICROSCOPE TECHNOLOGY
PRODUCTS OPTIONS
- Research Grade Profiler - VSI Controller
- Educational Grade Profiler - Objective Lens Turrett
- Modular Profiler - Vacuum Service Pak
- MEMScriptTM Software - Voltage Amplifier
OPTOPro Model 622-EDU Educational Grade 3D MEMS Profiler NEW!!
The Model 622-EDU is a low-cost 3D MEMS profiler specifically configured to meet the needs of educational institutions for microsystems training.
OPTOPro
Model 622-A Research Grade 3D MEMS Profiler
Based on patented long-working-distance interference microscope technology, the Model 622-A is suitable for three-dimensional imaging and dynamic measurements of micro-electro-mechanical (MEMS) devices.
OPTOPro
Model 622-X Modular 3D MEMS Profiler
The Model 622-X interferometer cross that is used in the Model 622-A and 622-EDU 3D MEMS Profilers can be purchased separately for integration into the customer's system.
Clear Focus corrects for insufficient depth-of-focus in high-magnification systems by "slicing" a stack of images and then integrating these slices to provide a single composite all-in-focus image.
Visual Inspector is a simple to use yet powerful software imaging system that provides the means to acquire, archive, analyze, and annotate video images.
Recent News Highlights-
"E M Optomechanical Announces Introduction of 3D MEMS Profiler for Microsystems Training," Press Release, July 2007.